More precision, more flexibility, more digitization
With the new version WM | Quartis R2025-2 WENZEL once again presents a wide range of powerful functions that make the entire measurement process more precise, flexible and efficient. From advanced point cloud functions to smart temperature compensation to live data integration.
Expansion of optical measurement with turntable
The latest version supports users with new options for interactive programming. Curves can be divided in a targeted manner, programmable variables and inputs make measurement programs more flexible and adaptable. Advanced temperature compensation ensures reliable measurement results, particularly with swiveled probe systems and turntable movements.
By expanding optical measurement to include turntable functions as the fourth axis, WM | Quartis R2025-2 is taking the digitization of complex components to the next level. Three new scanning methods enable rotational capture — ideal for inspecting turbine blades, for example.
Evaluate point clouds more efficiently
The new version noticeably speeds up element extraction from point clouds and provides reproducible results through preview functions, material thickness compensation and well-defined strategies. Advanced methods are also available for evaluating rectangles and oblong holes.
Whether smoothing, triangulating or identifying: The improved tools for point cloud processing support more precise evaluations and more efficient processes. Users also benefit from a higher scan frequency with the WM | LS 150 and WPC2050 optical sensors.
Smart Metrology
Automatic axis adjustment when calibrating the stylus system, faster turntable movements and improved offline programming increase ease of use and accuracy.
With the integration of the WM | RS-T roughness sensor, WM | Quartis R2025-2 now also offers software support for high-precision roughness measurements on gear components — including automated probe changes using the Multiple Probe Changer.
The new “Broadcast MQTT” interface enables live transmission of status data and messages, for example for analysis with the WM | SYS Analyzer — a further step towards smart metrology.
The new features in detail
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